Scanning near-field optical microscopy with aperture probes : fundamentals and applications

Hecht, Bert; Sick, Beate; Wild, Urs P.; Deckert, Volker; Zenobi, Renato; Martin, Olivier J. F.; Pohl, Dieter W.

doi:10.1063/1.481382

Publication type:	Article in scientific journal
Type of review:	Peer review (publication)
Title:	Scanning near-field optical microscopy with aperture probes : fundamentals and applications
Authors:	Hecht, Bert Sick, Beate Wild, Urs P. Deckert, Volker Zenobi, Renato Martin, Olivier J. F. Pohl, Dieter W.
DOI:	10.1063/1.481382
Published in:	The Journal of Chemical Physics
Volume(Issue):	112
Issue:	18
Page(s):	7761
Issue Date:	2000
Publisher / Ed. Institution:	American Institute of Physics
ISSN:	0021-9606 1520-9032 1089-7690
Language:	English
Subject (DDC):	540: Chemistry
Abstract:	In this review we describe fundamentals of scanning near-field optical microscopy with aperture probes. After the discussion of instrumentation and probe fabrication, aspects of light propagation in metal-coated, tapered optical fibers are considered. This includes transmission properties and field distributions in the vicinity of subwavelength apertures. Furthermore, the near-field optical image formation mechanism is analyzed with special emphasis on potential sources of artifacts. To underline the prospects of the technique, selected applications including amplitude and phase contrast imaging, fluorescence imaging, and Raman spectroscopy, as well as near-field optical desorption, are presented. These examples demonstrate that scanning near-field optical microscopy is no longer an exotic method but has matured into a valuable tool.
URI:	https://digitalcollection.zhaw.ch/handle/11475/14042
Fulltext version:	Published version
License (according to publishing contract):	Licence according to publishing contract
Departement:	School of Engineering
Organisational Unit:	Institute of Data Analysis and Process Design (IDP)
Appears in collections:	Publikationen School of Engineering

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Hecht, B., Sick, B., Wild, U. P., Deckert, V., Zenobi, R., Martin, O. J. F., & Pohl, D. W. (2000). Scanning near-field optical microscopy with aperture probes : fundamentals and applications. The Journal of Chemical Physics, 112(18), 7761. https://doi.org/10.1063/1.481382

Hecht, B. et al. (2000) ‘Scanning near-field optical microscopy with aperture probes : fundamentals and applications’, The Journal of Chemical Physics, 112(18), p. 7761. Available at: https://doi.org/10.1063/1.481382.

B. Hecht et al., “Scanning near-field optical microscopy with aperture probes : fundamentals and applications,” The Journal of Chemical Physics, vol. 112, no. 18, p. 7761, 2000, doi: 10.1063/1.481382.

HECHT, Bert, Beate SICK, Urs P. WILD, Volker DECKERT, Renato ZENOBI, Olivier J. F. MARTIN und Dieter W. POHL, 2000. Scanning near-field optical microscopy with aperture probes : fundamentals and applications. The Journal of Chemical Physics. 2000. Bd. 112, Nr. 18, S. 7761. DOI 10.1063/1.481382

Hecht, Bert, Beate Sick, Urs P. Wild, Volker Deckert, Renato Zenobi, Olivier J. F. Martin, and Dieter W. Pohl. 2000. “Scanning Near-Field Optical Microscopy with Aperture Probes : Fundamentals and Applications.” The Journal of Chemical Physics 112 (18): 7761. https://doi.org/10.1063/1.481382.

Hecht, Bert, et al. “Scanning Near-Field Optical Microscopy with Aperture Probes : Fundamentals and Applications.” The Journal of Chemical Physics, vol. 112, no. 18, 2000, p. 7761, https://doi.org/10.1063/1.481382.