Finite element modeling for analysis of electroluminescence and infrared images of thin-film solar cells

Diethelm, Matthias; Penninck, Lieven; Regnat, Markus; Offermans, Ton; Zimmermann, Birger; Kirsch, Christoph; Hiestand, Roman; Altazin, Stéphane; Ruhstaller, Beat

doi:10.1016/j.solener.2020.08.058

Please use this identifier to cite or link to this item: https://doi.org/10.21256/zhaw-24641

Publication type:	Article in scientific journal
Type of review:	Peer review (publication)
Title:	Finite element modeling for analysis of electroluminescence and infrared images of thin-film solar cells
Authors:	Diethelm, Matthias Penninck, Lieven Regnat, Markus Offermans, Ton Zimmermann, Birger Kirsch, Christoph Hiestand, Roman Altazin, Stéphane Ruhstaller, Beat
et. al:	No
DOI:	10.1016/j.solener.2020.08.058 10.21256/zhaw-24641
Published in:	Solar Energy
Volume(Issue):	209
Page(s):	186
Pages to:	193
Issue Date:	Oct-2020
Publisher / Ed. Institution:	Elsevier
ISSN:	0038-092X
Language:	English
Subjects:	Photovoltaik; Thermal imaging; Electrothermal simulation; Organic photovoltaics; Finite element method (FEM)
Subject (DDC):	621.3: Electrical, communications, control engineering
Abstract:	Sheet resistance losses and local defects are challenges faced in solar module fabrication and upscaling processes. Commonly used investigation tools are non-invasive optical and thermal imaging techniques, such as electroluminescence, photoluminescence as well as illuminated and dark infrared imaging. Here, we investigate the potential of computationally efficient finite element simulation of solar cells and modules by considering planar electrodes coupled by a local current–voltage coupling law. Sheet resistances are determined by fitting current simulation results of an OPV solar cell to electroluminescence imaging data. Moreover, a thermal model is introduced that accounts for Joule heating due to an electrothermal coupling. A direct comparison of simulated temperature maps to measured infrared images is therefore possible. The electrothermal model is successfully validated by comparing measured and simulated temperature profiles across four interconnected organic solar cells of a mini-module. Furthermore, the influence of shunts on the thermal behavior of OPV modules is investigated by comparing electrothermal simulation results to dark lock-In IR thermography images.
URI:	https://digitalcollection.zhaw.ch/handle/11475/24641
Fulltext version:	Published version
License (according to publishing contract):	CC BY-NC-ND 4.0: Attribution - Non commercial - No derivatives 4.0 International
Departement:	School of Engineering
Organisational Unit:	Institute of Computational Physics (ICP)
Appears in collections:	Publikationen School of Engineering

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Diethelm, M., Penninck, L., Regnat, M., Offermans, T., Zimmermann, B., Kirsch, C., Hiestand, R., Altazin, S., & Ruhstaller, B. (2020). Finite element modeling for analysis of electroluminescence and infrared images of thin-film solar cells. Solar Energy, 209, 186–193. https://doi.org/10.1016/j.solener.2020.08.058

Diethelm, M. et al. (2020) ‘Finite element modeling for analysis of electroluminescence and infrared images of thin-film solar cells’, Solar Energy, 209, pp. 186–193. Available at: https://doi.org/10.1016/j.solener.2020.08.058.

M. Diethelm et al., “Finite element modeling for analysis of electroluminescence and infrared images of thin-film solar cells,” Solar Energy, vol. 209, pp. 186–193, Oct. 2020, doi: 10.1016/j.solener.2020.08.058.

DIETHELM, Matthias, Lieven PENNINCK, Markus REGNAT, Ton OFFERMANS, Birger ZIMMERMANN, Christoph KIRSCH, Roman HIESTAND, Stéphane ALTAZIN und Beat RUHSTALLER, 2020. Finite element modeling for analysis of electroluminescence and infrared images of thin-film solar cells. Solar Energy. Oktober 2020. Bd. 209, S. 186–193. DOI 10.1016/j.solener.2020.08.058

Diethelm, Matthias, Lieven Penninck, Markus Regnat, Ton Offermans, Birger Zimmermann, Christoph Kirsch, Roman Hiestand, Stéphane Altazin, and Beat Ruhstaller. 2020. “Finite Element Modeling for Analysis of Electroluminescence and Infrared Images of Thin-Film Solar Cells.” Solar Energy 209 (October): 186–93. https://doi.org/10.1016/j.solener.2020.08.058.

Diethelm, Matthias, et al. “Finite Element Modeling for Analysis of Electroluminescence and Infrared Images of Thin-Film Solar Cells.” Solar Energy, vol. 209, Oct. 2020, pp. 186–93, https://doi.org/10.1016/j.solener.2020.08.058.