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Please use this identifier to cite or link to this item: https://doi.org/10.21256/zhaw-1993
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dc.contributor.authorAltazin, Stéphane-
dc.contributor.authorReynaud, Clément-
dc.contributor.authorMayer, Ursula Maria-
dc.contributor.authorLanz, Thomas-
dc.contributor.authorLapagna, Kevin-
dc.contributor.authorKnaack, Reto-
dc.contributor.authorPenninck, Lieven-
dc.contributor.authorKirsch, Christoph-
dc.contributor.authorPernstich, Kurt P.-
dc.contributor.authorHarkema, Stephan-
dc.contributor.authorHermes, Dorothee-
dc.contributor.authorRuhstaller, Beat-
dc.date.accessioned2018-06-15T11:57:15Z-
dc.date.available2018-06-15T11:57:15Z-
dc.date.issued2015-
dc.identifier.issn0097-966Xde_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/6937-
dc.description.abstractA multi-scale optical model for organic light-emitting devices containing scattering layers is presented. This model describes the radiation of embedded oscillating dipoles and scattering from spherical particles. After successful model validation with experiments on a top-emitting white OLED, we show how this tool can be used for optimization with specific targets.de_CH
dc.language.isoende_CH
dc.publisherWiley-Blackwell Publishingde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subjectOLEDde_CH
dc.subjectLight-scatteringde_CH
dc.subjectSimulationde_CH
dc.subjectMie particlede_CH
dc.subject.ddc621.3: Elektrotechnik und Elektronikde_CH
dc.titleSimulations, measurements and optimization of OLEDs with scattering layerde_CH
dc.typeKonferenz: Paperde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitute of Computational Physics (ICP)de_CH
dc.identifier.doi10.21256/zhaw-1993-
dc.identifier.doi10.1002/sdtp.10478de_CH
zhaw.conference.detailsInternational Symposium of the Society for Information display (SID), San Jose, USA, 21 May - 5 June 2015de_CH
zhaw.funding.euinfo:eu-repo/grantAgreement/EC/FP7/295368//Integrated Multidisciplinary & Multiscale Modeling for Organic Light-Emitting Diodes/IM3OLEDde_CH
zhaw.originated.zhawYesde_CH
zhaw.pages.end567de_CH
zhaw.pages.start564de_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.volume46de_CH
zhaw.publication.reviewPeer review (Publikation)de_CH
zhaw.title.proceedingsSID international symposium : digest of technical papersde_CH
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