Simulations, measurements and optimization of OLEDs with scattering layer

Altazin, Stéphane; Reynaud, Clément; Mayer, Ursula Maria; Lanz, Thomas; Lapagna, Kevin; Knaack, Reto; Penninck, Lieven; Kirsch, Christoph; Pernstich, Kurt P.; Harkema, Stephan; Hermes, Dorothee; Ruhstaller, Beat

doi:10.1002/sdtp.10478

Please use this identifier to cite or link to this item: https://doi.org/10.21256/zhaw-1993

Publication type:	Conference paper
Type of review:	Peer review (publication)
Title:	Simulations, measurements and optimization of OLEDs with scattering layer
Authors:	Altazin, Stéphane Reynaud, Clément Mayer, Ursula Maria Lanz, Thomas Lapagna, Kevin Knaack, Reto Penninck, Lieven Kirsch, Christoph Pernstich, Kurt P. Harkema, Stephan Hermes, Dorothee Ruhstaller, Beat
DOI:	10.1002/sdtp.10478 10.21256/zhaw-1993
Proceedings:	SID international symposium : digest of technical papers
Volume(Issue):	46
Page(s):	564
Pages to:	567
Conference details:	International Symposium of the Society for Information display (SID), San Jose, USA, 21 May - 5 June 2015
Issue Date:	2015
Publisher / Ed. Institution:	Wiley
ISSN:	0097-966X
Language:	English
Subjects:	OLED; Light-scattering; Simulation; Mie particle
Subject (DDC):	621.3: Electrical, communications, control engineering
Abstract:	A multi-scale optical model for organic light-emitting devices containing scattering layers is presented. This model describes the radiation of embedded oscillating dipoles and scattering from spherical particles. After successful model validation with experiments on a top-emitting white OLED, we show how this tool can be used for optimization with specific targets.
URI:	https://digitalcollection.zhaw.ch/handle/11475/6937
Fulltext version:	Published version
License (according to publishing contract):	Licence according to publishing contract
Departement:	School of Engineering
Organisational Unit:	Institute of Computational Physics (ICP)
Appears in collections:	Publikationen School of Engineering

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Altazin, S., Reynaud, C., Mayer, U. M., Lanz, T., Lapagna, K., Knaack, R., Penninck, L., Kirsch, C., Pernstich, K. P., Harkema, S., Hermes, D., & Ruhstaller, B. (2015). Simulations, measurements and optimization of OLEDs with scattering layer [Conference paper]. SID International Symposium : Digest of Technical Papers, 46, 564–567. https://doi.org/10.1002/sdtp.10478

Altazin, S. et al. (2015) ‘Simulations, measurements and optimization of OLEDs with scattering layer’, in SID international symposium : digest of technical papers. Wiley, pp. 564–567. Available at: https://doi.org/10.1002/sdtp.10478.

S. Altazin et al., “Simulations, measurements and optimization of OLEDs with scattering layer,” in SID international symposium : digest of technical papers, 2015, vol. 46, pp. 564–567. doi: 10.1002/sdtp.10478.

ALTAZIN, Stéphane, Clément REYNAUD, Ursula Maria MAYER, Thomas LANZ, Kevin LAPAGNA, Reto KNAACK, Lieven PENNINCK, Christoph KIRSCH, Kurt P. PERNSTICH, Stephan HARKEMA, Dorothee HERMES und Beat RUHSTALLER, 2015. Simulations, measurements and optimization of OLEDs with scattering layer. In: SID international symposium : digest of technical papers. Conference paper. Wiley. 2015. S. 564–567

Altazin, Stéphane, Clément Reynaud, Ursula Maria Mayer, Thomas Lanz, Kevin Lapagna, Reto Knaack, Lieven Penninck, et al. 2015. “Simulations, Measurements and Optimization of OLEDs with Scattering Layer.” Conference paper. In SID International Symposium : Digest of Technical Papers, 46:564–67. Wiley. https://doi.org/10.1002/sdtp.10478.

Altazin, Stéphane, et al. “Simulations, Measurements and Optimization of OLEDs with Scattering Layer.” SID International Symposium : Digest of Technical Papers, vol. 46, Wiley, 2015, pp. 564–67, https://doi.org/10.1002/sdtp.10478.