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Issue Date | Title | Involved Person(s) |
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14-Jun-2017 | Method and device for characterizing the linear properties of an electrical component | Niayesh, Kaveh; Berth, Matthias; Dahlquist, Andreas; Tiberg, Martin; Heitz, Christoph |
29-Aug-2007 | Verfahren und Vorrichtung zur Stoffuntersuchung | Hütter, Thomas; Heitz, Christoph; Schawe, Jürgen |
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