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  2. School of Engineering
  3. Patente
  4. Patente School of Engineering
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dc.contributor.otherNiayesh, Kaveh-
dc.contributor.otherBerth, Matthias-
dc.contributor.otherDahlquist, Andreas-
dc.contributor.otherTiberg, Martin-
dc.contributor.otherHeitz, Christoph-
dc.date.accessioned2019-05-06T09:32:00Z-
dc.date.available2019-05-06T09:32:00Z-
dc.date.issued2017-06-14-
dc.date.submitted2005-01-21-
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/17030-
dc.identifier.urihttps://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1de_CH
dc.description.abstractThe invention relates to a method and a device for characterizing the linear properties of an electrical multiport component. It also relates to a method for modeling an electrical system with at least one component characterized in this manner.de_CH
dc.description.sponsorshipABB Research Ltdde_CH
dc.language.isoende_CH
dc.subject.ddc621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnikde_CH
dc.titleMethod and device for characterizing the linear properties of an electrical componentde_CH
dc.title.alternativeVerfahren und Vorrichtung zur Charakterisierung der linearen Eigenschaften einer elektrischen Komponentede_CH
dc.title.alternativeProcédé et dispositif pour caractériser les propriétés linéaires d'un composant électriquede_CH
dc.typePatentde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitut für Datenanalyse und Prozessdesign (IDP)de_CH
zhaw.funding.euNode_CH
zhaw.originated.zhawYesde_CH
zhaw.id.patentEP1684081de_CH
zhaw.publication.codeB1de_CH
zhaw.display.portraitYesde_CH
zhaw.relation.patentBRPI0606482A2de_CH
zhaw.relation.patentCA2601321A1de_CH
zhaw.relation.patentCA2601321Cde_CH
zhaw.relation.patentCN101107533Ade_CH
zhaw.relation.patentCN101107533Bde_CH
zhaw.relation.patentES2638765T3de_CH
zhaw.relation.patentNO20074246Lde_CH
zhaw.relation.patentRU2007131587Ade_CH
zhaw.relation.patentRU2383027C2de_CH
zhaw.relation.patentUS2007285109A1de_CH
zhaw.relation.patentUS8154311B2de_CH
zhaw.relation.patentWO2006076824A1de_CH
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Niayesh, K., Berth, M., Dahlquist, A., Tiberg, M., & Heitz, C. (2017). Method and device for characterizing the linear properties of an electrical component (Patent No. EP1684081B1). https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1
Niayesh, K. et al. (2017) ‘Method and device for characterizing the linear properties of an electrical component’. Available at: https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1.
K. Niayesh, M. Berth, A. Dahlquist, M. Tiberg, and C. Heitz, “Method and device for characterizing the linear properties of an electrical component,” EP1684081B1, Jun. 14, 2017 [Online]. Available: https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1
NIAYESH, Kaveh, Matthias BERTH, Andreas DAHLQUIST, Martin TIBERG und Christoph HEITZ, 2017. Method and device for characterizing the linear properties of an electrical component [online]. EP1684081B1. 14 Juni 2017. Verfügbar unter: https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1
Niayesh, Kaveh, Matthias Berth, Andreas Dahlquist, Martin Tiberg, and Christoph Heitz. 2017. Method and device for characterizing the linear properties of an electrical component. EP1684081B1, filed January 21, 2005, and issued June 14, 2017. https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1.
Niayesh, Kaveh, et al. Method and Device for Characterizing the Linear Properties of an Electrical Component. EP1684081B1, 14 June 2017, https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1.


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