Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.other | Geers, Christoph | - |
| dc.contributor.other | Bonmarin, Mathias | - |
| dc.contributor.other | Fink, Alke | - |
| dc.contributor.other | Monnier, Christophe | - |
| dc.date.accessioned | 2019-08-26T15:18:49Z | - |
| dc.date.available | 2019-08-26T15:18:49Z | - |
| dc.date.issued | 2020-06-11 | - |
| dc.date.submitted | 2018-05-09 | - |
| dc.identifier.uri | https://worldwide.espacenet.com/patent/search?q=pn%3DUS2020182813A1 | de_CH |
| dc.identifier.uri | https://digitalcollection.zhaw.ch/handle/11475/17977 | - |
| dc.description.abstract | A method for characterizing particles producing heat when exposed to light. The method includes the steps of stimulating a particle sample alternatingly with homogenous light waves with at least a first wavelength and a second wavelength, detecting by a detector heat radiated by the particle sample as a result of the stimulation, thereby yielding time-dependent images of a modulated heat distribution pattern, converting the time-dependent image of the modulated heat distribution pattern into the frequency domain and demodulating the image of the modulated heat distribution pattern, and determining a physical property of the particle sample based on the at least one demodulated image of heat distribution. | de_CH |
| dc.description.sponsorship | NanoLockin GmbH | de_CH |
| dc.language.iso | en | de_CH |
| dc.title | Method for characterizing particles producing heat when exposed to light and device for carrying out the method | de_CH |
| dc.type | Patent | de_CH |
| dcterms.type | Text | de_CH |
| zhaw.departement | School of Engineering | de_CH |
| zhaw.organisationalunit | Institute of Computational Physics (ICP) | de_CH |
| zhaw.funding.eu | No | de_CH |
| zhaw.originated.zhaw | Yes | de_CH |
| zhaw.webfeed | Sensors and Measuring Systems | de_CH |
| zhaw.id.patent | US2020182813 | de_CH |
| zhaw.publication.code | A1 | de_CH |
| zhaw.display.portrait | Yes | de_CH |
| zhaw.relation.patent | CA3063240A1 | de_CH |
| zhaw.relation.patent | EP3631411A1 | de_CH |
| zhaw.relation.patent | WO2018219610A1 | de_CH |
| Appears in collections: | Patente School of Engineering | |
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Geers, C., Bonmarin, M., Fink, A., & Monnier, C. (2020). Method for characterizing particles producing heat when exposed to light and device for carrying out the method (Patent No. US2020182813A1). https://worldwide.espacenet.com/patent/search?q=pn%3DUS2020182813A1
Geers, C. et al. (2020) ‘Method for characterizing particles producing heat when exposed to light and device for carrying out the method’. Available at: https://worldwide.espacenet.com/patent/search?q=pn%3DUS2020182813A1.
C. Geers, M. Bonmarin, A. Fink, and C. Monnier, “Method for characterizing particles producing heat when exposed to light and device for carrying out the method,” US2020182813A1, Jun. 11, 2020 [Online]. Available: https://worldwide.espacenet.com/patent/search?q=pn%3DUS2020182813A1
GEERS, Christoph, Mathias BONMARIN, Alke FINK und Christophe MONNIER, 2020. Method for characterizing particles producing heat when exposed to light and device for carrying out the method [online]. US2020182813A1. 11 Juni 2020. Verfügbar unter: https://worldwide.espacenet.com/patent/search?q=pn%3DUS2020182813A1
Geers, Christoph, Mathias Bonmarin, Alke Fink, and Christophe Monnier. 2020. Method for characterizing particles producing heat when exposed to light and device for carrying out the method. US2020182813A1, filed May 9, 2018, and issued June 11, 2020. https://worldwide.espacenet.com/patent/search?q=pn%3DUS2020182813A1.
Geers, Christoph, et al. Method for Characterizing Particles Producing Heat When Exposed to Light and Device for Carrying out the Method. US2020182813A1, 11 June 2020, https://worldwide.espacenet.com/patent/search?q=pn%3DUS2020182813A1.
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