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dc.contributor.authorDicker, Jochen-
dc.contributor.authorSchumacher, Jürgen-
dc.contributor.authorSölter, Jens-
dc.contributor.authorZimmermann, Walter-
dc.contributor.authorBau, Sandra-
dc.contributor.authorWarta, Wilhelm-
dc.date.accessioned2018-10-11T14:48:17Z-
dc.date.available2018-10-11T14:48:17Z-
dc.date.issued2000-
dc.identifier.isbn1-902916-18-2de_CH
dc.identifier.urihttps://www.osti.gov/etdeweb/biblio/20195361de_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/11718-
dc.language.isoende_CH
dc.publisherJames and Jamesde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subjectSio2 barrierde_CH
dc.subjectThin filmde_CH
dc.subjectSilicon solar cellsde_CH
dc.subjectSimulationde_CH
dc.subject.ddc621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnikde_CH
dc.titleNumerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layersde_CH
dc.typeKonferenz: Paperde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitute of Computational Physics (ICP)de_CH
zhaw.publisher.placeLondonde_CH
zhaw.conference.details16th European Photovoltaic Solar Energy Conference, Glasgow, UK, 1-5 May 2000de_CH
zhaw.funding.euNode_CH
zhaw.originated.zhawNode_CH
zhaw.pages.end1462de_CH
zhaw.pages.start1459de_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.volume2de_CH
zhaw.publication.reviewEditorial reviewde_CH
zhaw.title.proceedingsSixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the international conference held in Glasgow, United Kingdom, 1 - 5 May 2000de_CH
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Dicker, J., Schumacher, J., Sölter, J., Zimmermann, W., Bau, S., & Warta, W. (2000). Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers [Conference paper]. Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the International Conference Held in Glasgow, United Kingdom, 1 - 5 May 2000, 2, 1459–1462. https://www.osti.gov/etdeweb/biblio/20195361
Dicker, J. et al. (2000) ‘Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers’, in Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the international conference held in Glasgow, United Kingdom, 1 - 5 May 2000. London: James and James, pp. 1459–1462. Available at: https://www.osti.gov/etdeweb/biblio/20195361.
J. Dicker, J. Schumacher, J. Sölter, W. Zimmermann, S. Bau, and W. Warta, “Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers,” in Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the international conference held in Glasgow, United Kingdom, 1 - 5 May 2000, 2000, vol. 2, pp. 1459–1462. [Online]. Available: https://www.osti.gov/etdeweb/biblio/20195361
DICKER, Jochen, Jürgen SCHUMACHER, Jens SÖLTER, Walter ZIMMERMANN, Sandra BAU und Wilhelm WARTA, 2000. Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers. In: Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the international conference held in Glasgow, United Kingdom, 1 - 5 May 2000 [online]. Conference paper. London: James and James. 2000. S. 1459–1462. ISBN 1-902916-18-2. Verfügbar unter: https://www.osti.gov/etdeweb/biblio/20195361
Dicker, Jochen, Jürgen Schumacher, Jens Sölter, Walter Zimmermann, Sandra Bau, and Wilhelm Warta. 2000. “Numerical Analysis of Crystalline Silicon Thin Film Solar Cells on Perforated SiO2 Barrier Layers.” Conference paper. In Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the International Conference Held in Glasgow, United Kingdom, 1 - 5 May 2000, 2:1459–62. London: James and James. https://www.osti.gov/etdeweb/biblio/20195361.
Dicker, Jochen, et al. “Numerical Analysis of Crystalline Silicon Thin Film Solar Cells on Perforated SiO2 Barrier Layers.” Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the International Conference Held in Glasgow, United Kingdom, 1 - 5 May 2000, vol. 2, James and James, 2000, pp. 1459–62, https://www.osti.gov/etdeweb/biblio/20195361.


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