Opto-electronic characterization of third-generation solar cells

Neukom, Martin; Züfle, Simon; Jenatsch, Sandra; Ruhstaller, Beat

doi:10.21256/zhaw-3370

Please use this identifier to cite or link to this item: https://doi.org/10.21256/zhaw-3370

Publication type:	Article in scientific journal
Type of review:	Peer review (publication)
Title:	Opto-electronic characterization of third-generation solar cells
Authors:	Neukom, Martin Züfle, Simon Jenatsch, Sandra Ruhstaller, Beat
DOI:	10.21256/zhaw-3370 10.1080/14686996.2018.1442091
Published in:	Science and Technology of Advanced Materials
Volume(Issue):	19
Issue:	1
Page(s):	291
Pages to:	316
Issue Date:	2018
Publisher / Ed. Institution:	Taylor & Francis
ISSN:	1468-6996 1878-5514
Language:	English
Subjects:	209 Solar cell / Photovoltaics; 40 Optical, magnetic and electronic device material; CELIV; DLTS; IMPS; OCVD; TPC; TPV; Charge carrier mobility; Impedance spectroscopy; Organic solar cell; Perovskite solar cell
Subject (DDC):	621.3: Electrical, communications, control engineering
Abstract:	We present an overview of opto-electronic characterization techniques for solar cells including light-induced charge extraction by linearly increasing voltage, impedance spectroscopy, transient photovoltage, charge extraction and more. Guidelines for the interpretation of experimental results are derived based on charge drift-diffusion simulations of solar cells with common performance limitations. It is investigated how nonidealities like charge injection barriers, traps and low mobilities among others manifest themselves in each of the studied cell characterization techniques. Moreover, comprehensive parameter extraction for an organic bulk-heterojunction solar cell comprising PCDTBT:PC70BM is demonstrated. The simulations reproduce measured results of 9 different experimental techniques. Parameter correlation is minimized due to the combination of various techniques. Thereby a route to comprehensive and accurate parameter extraction is identified.
URI:	https://digitalcollection.zhaw.ch/handle/11475/15629
Fulltext version:	Published version
License (according to publishing contract):	CC BY 4.0: Attribution 4.0 International
Departement:	School of Engineering
Organisational Unit:	Institute of Applied Mathematics and Physics (IAMP)
Published as part of the ZHAW project:	PV2050: Sustainability, market deployment and interaction to the grid – the impacts of advanced PV
Appears in collections:	Publikationen School of Engineering

Files in This Item:

File	Description	Size	Format
Neukom et al. - 2018 - Opto-electronic characterization of third-generati.pdf		2.77 MB	Adobe PDF	View/Open

Show full item record

Neukom, M., Züfle, S., Jenatsch, S., & Ruhstaller, B. (2018). Opto-electronic characterization of third-generation solar cells. Science and Technology of Advanced Materials, 19(1), 291–316. https://doi.org/10.21256/zhaw-3370

Neukom, M. et al. (2018) ‘Opto-electronic characterization of third-generation solar cells’, Science and Technology of Advanced Materials, 19(1), pp. 291–316. Available at: https://doi.org/10.21256/zhaw-3370.

M. Neukom, S. Züfle, S. Jenatsch, and B. Ruhstaller, “Opto-electronic characterization of third-generation solar cells,” Science and Technology of Advanced Materials, vol. 19, no. 1, pp. 291–316, 2018, doi: 10.21256/zhaw-3370.

NEUKOM, Martin, Simon ZÜFLE, Sandra JENATSCH und Beat RUHSTALLER, 2018. Opto-electronic characterization of third-generation solar cells. Science and Technology of Advanced Materials. 2018. Bd. 19, Nr. 1, S. 291–316. DOI 10.21256/zhaw-3370

Neukom, Martin, Simon Züfle, Sandra Jenatsch, and Beat Ruhstaller. 2018. “Opto-Electronic Characterization of Third-Generation Solar Cells.” Science and Technology of Advanced Materials 19 (1): 291–316. https://doi.org/10.21256/zhaw-3370.

Neukom, Martin, et al. “Opto-Electronic Characterization of Third-Generation Solar Cells.” Science and Technology of Advanced Materials, vol. 19, no. 1, 2018, pp. 291–316, https://doi.org/10.21256/zhaw-3370.