Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Regnat, M. | - |
| dc.contributor.author | Jenatsch, S. | - |
| dc.contributor.author | Züfle, S. | - |
| dc.contributor.author | Pernstich, K. P. | - |
| dc.contributor.author | Ruhstaller, B. | - |
| dc.date.accessioned | 2022-03-28T12:46:11Z | - |
| dc.date.available | 2022-03-28T12:46:11Z | - |
| dc.date.issued | 2021-08 | - |
| dc.identifier.uri | https://digitalcollection.zhaw.ch/handle/11475/24654 | - |
| dc.language.iso | en | de_CH |
| dc.rights | Not specified | de_CH |
| dc.subject.ddc | 621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnik | de_CH |
| dc.title | Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms | de_CH |
| dc.type | Konferenz: Sonstiges | de_CH |
| dcterms.type | Text | de_CH |
| zhaw.departement | School of Engineering | de_CH |
| zhaw.organisationalunit | Institute of Computational Physics (ICP) | de_CH |
| zhaw.conference.details | 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021 | de_CH |
| zhaw.funding.eu | No | de_CH |
| zhaw.originated.zhaw | Yes | de_CH |
| zhaw.publication.status | submittedVersion | de_CH |
| zhaw.publication.review | Peer review (Abstract) | de_CH |
| zhaw.funding.snf | 162230 | de_CH |
| zhaw.webfeed | Multiphysics Modeling | de_CH |
| zhaw.author.additional | No | de_CH |
| zhaw.display.portrait | Yes | de_CH |
| Appears in collections: | Publikationen School of Engineering | |
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Regnat, M., Jenatsch, S., Züfle, S., Pernstich, K. P., & Ruhstaller, B. (2021, August). Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms. 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021.
Regnat, M. et al. (2021) ‘Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms’, in 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021.
M. Regnat, S. Jenatsch, S. Züfle, K. P. Pernstich, and B. Ruhstaller, “Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms,” in 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021, Aug. 2021.
REGNAT, M., S. JENATSCH, S. ZÜFLE, K. P. PERNSTICH und B. RUHSTALLER, 2021. Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms. In: 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021. Conference presentation. August 2021
Regnat, M., S. Jenatsch, S. Züfle, K. P. Pernstich, and B. Ruhstaller. 2021. “Advanced Characterization and Device Simulation towards Better Understanding of OLED Degradation Mechanisms.” Conference presentation. In 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021.
Regnat, M., et al. “Advanced Characterization and Device Simulation towards Better Understanding of OLED Degradation Mechanisms.” 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021, 2021.
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