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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Miny, Torben | - |
dc.contributor.author | Heppner, Sebastian | - |
dc.contributor.author | Garmaev, Igor | - |
dc.contributor.author | Kleinert, Tobias | - |
dc.contributor.author | Ristin, Marko | - |
dc.contributor.author | van de Venn, Hans Wernher | - |
dc.contributor.author | Otto, Bjorn | - |
dc.contributor.author | Meinecke, Karsten | - |
dc.contributor.author | Diedrich, Christian | - |
dc.contributor.author | Braunisch, Nico | - |
dc.contributor.author | Wollschlaeger, Martin | - |
dc.date.accessioned | 2023-02-17T10:38:40Z | - |
dc.date.available | 2023-02-17T10:38:40Z | - |
dc.date.issued | 2022 | - |
dc.identifier.isbn | 978-1-7281-7568-3 | de_CH |
dc.identifier.uri | https://digitalcollection.zhaw.ch/handle/11475/27080 | - |
dc.description.abstract | The digital twin, or more precisely the Asset Administration Shell, is the key element for interoperability in Industrie 4.0. Together with the asset, it forms the I4.0 component. For the development of I4.0 components, the availability of suitable software development tools is becoming increasingly relevant. However, it is not yet specified how these tools are to be systematically tested for correctness, compliance and conformity. These topics are the focus of this work. We show different established testing methods, evaluate their suitability and describe an approach for a capable test environment. | de_CH |
dc.language.iso | en | de_CH |
dc.publisher | IEEE | de_CH |
dc.rights | Licence according to publishing contract | de_CH |
dc.subject | Industrie 4.0 | de_CH |
dc.subject | Digital twin | de_CH |
dc.subject | Testing | de_CH |
dc.subject | Verification | de_CH |
dc.subject | Validation | de_CH |
dc.subject | Asset Administration Shell | de_CH |
dc.subject | Software development | de_CH |
dc.subject.ddc | 003: Systeme | de_CH |
dc.title | Semi-automatic testing of data-focused software development kits for Industrie 4.0 | de_CH |
dc.type | Konferenz: Paper | de_CH |
dcterms.type | Text | de_CH |
zhaw.departement | School of Engineering | de_CH |
zhaw.organisationalunit | Institut für Mechatronische Systeme (IMS) | de_CH |
dc.identifier.doi | 10.1109/INDIN51773.2022.9976069 | de_CH |
zhaw.conference.details | 20th International Conference on Industrial Informatics (INDIN), Perth, Australia, 25-28 July 2022 | de_CH |
zhaw.funding.eu | No | de_CH |
zhaw.originated.zhaw | Yes | de_CH |
zhaw.pages.end | 274 | de_CH |
zhaw.pages.start | 269 | de_CH |
zhaw.publication.status | publishedVersion | de_CH |
zhaw.publication.review | Peer review (Abstract) | de_CH |
zhaw.title.proceedings | 2022 IEEE 20th International Conference on Industrial Informatics (INDIN) | de_CH |
zhaw.author.additional | No | de_CH |
zhaw.display.portrait | Yes | de_CH |
Appears in collections: | Publikationen School of Engineering |
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Miny, T., Heppner, S., Garmaev, I., Kleinert, T., Ristin, M., van de Venn, H. W., Otto, B., Meinecke, K., Diedrich, C., Braunisch, N., & Wollschlaeger, M. (2022). Semi-automatic testing of data-focused software development kits for Industrie 4.0 [Conference paper]. 2022 IEEE 20th International Conference on Industrial Informatics (INDIN), 269–274. https://doi.org/10.1109/INDIN51773.2022.9976069
Miny, T. et al. (2022) ‘Semi-automatic testing of data-focused software development kits for Industrie 4.0’, in 2022 IEEE 20th International Conference on Industrial Informatics (INDIN). IEEE, pp. 269–274. Available at: https://doi.org/10.1109/INDIN51773.2022.9976069.
T. Miny et al., “Semi-automatic testing of data-focused software development kits for Industrie 4.0,” in 2022 IEEE 20th International Conference on Industrial Informatics (INDIN), 2022, pp. 269–274. doi: 10.1109/INDIN51773.2022.9976069.
MINY, Torben, Sebastian HEPPNER, Igor GARMAEV, Tobias KLEINERT, Marko RISTIN, Hans Wernher VAN DE VENN, Bjorn OTTO, Karsten MEINECKE, Christian DIEDRICH, Nico BRAUNISCH und Martin WOLLSCHLAEGER, 2022. Semi-automatic testing of data-focused software development kits for Industrie 4.0. In: 2022 IEEE 20th International Conference on Industrial Informatics (INDIN). Conference paper. IEEE. 2022. S. 269–274. ISBN 978-1-7281-7568-3
Miny, Torben, Sebastian Heppner, Igor Garmaev, Tobias Kleinert, Marko Ristin, Hans Wernher van de Venn, Bjorn Otto, et al. 2022. “Semi-Automatic Testing of Data-Focused Software Development Kits for Industrie 4.0.” Conference paper. In 2022 IEEE 20th International Conference on Industrial Informatics (INDIN), 269–74. IEEE. https://doi.org/10.1109/INDIN51773.2022.9976069.
Miny, Torben, et al. “Semi-Automatic Testing of Data-Focused Software Development Kits for Industrie 4.0.” 2022 IEEE 20th International Conference on Industrial Informatics (INDIN), IEEE, 2022, pp. 269–74, https://doi.org/10.1109/INDIN51773.2022.9976069.
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