Determination of charge transport activation energy and injection barrier in organic semiconductor devices

Züfle, Simon; Altazin, Stéphane; Hofmann, Alexander; Jäger, Lars; Neukom, Martin T.; Brütting, Wolfgang; Ruhstaller, Beat

doi:10.1063/1.4992041

Please use this identifier to cite or link to this item: https://doi.org/10.21256/zhaw-2764

Publication type:	Article in scientific journal
Type of review:	Peer review (publication)
Title:	Determination of charge transport activation energy and injection barrier in organic semiconductor devices
Authors:	Züfle, Simon Altazin, Stéphane Hofmann, Alexander Jäger, Lars Neukom, Martin T. Brütting, Wolfgang Ruhstaller, Beat
DOI:	10.1063/1.4992041 10.21256/zhaw-2764
Published in:	Journal of Applied Physics
Volume(Issue):	122
Issue:	115502
Issue Date:	Sep-2017
Publisher / Ed. Institution:	American Institute of Physics
ISSN:	0021-8979 1089-7550
Language:	English
Subject (DDC):	621.3: Electrical, communications, control engineering
URI:	https://digitalcollection.zhaw.ch/handle/11475/2764
Fulltext version:	Published version
License (according to publishing contract):	CC BY 4.0: Attribution 4.0 International
Departement:	School of Engineering
Organisational Unit:	Institute of Computational Physics (ICP)
Appears in collections:	Publikationen School of Engineering

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Züfle, S., Altazin, S., Hofmann, A., Jäger, L., Neukom, M. T., Brütting, W., & Ruhstaller, B. (2017). Determination of charge transport activation energy and injection barrier in organic semiconductor devices. Journal of Applied Physics, 122(115502). https://doi.org/10.1063/1.4992041

Züfle, S. et al. (2017) ‘Determination of charge transport activation energy and injection barrier in organic semiconductor devices’, Journal of Applied Physics, 122(115502). Available at: https://doi.org/10.1063/1.4992041.

S. Züfle et al., “Determination of charge transport activation energy and injection barrier in organic semiconductor devices,” Journal of Applied Physics, vol. 122, no. 115502, Sep. 2017, doi: 10.1063/1.4992041.

ZÜFLE, Simon, Stéphane ALTAZIN, Alexander HOFMANN, Lars JÄGER, Martin T. NEUKOM, Wolfgang BRÜTTING und Beat RUHSTALLER, 2017. Determination of charge transport activation energy and injection barrier in organic semiconductor devices. Journal of Applied Physics. September 2017. Bd. 122, Nr. 115502. DOI 10.1063/1.4992041

Züfle, Simon, Stéphane Altazin, Alexander Hofmann, Lars Jäger, Martin T. Neukom, Wolfgang Brütting, and Beat Ruhstaller. 2017. “Determination of Charge Transport Activation Energy and Injection Barrier in Organic Semiconductor Devices.” Journal of Applied Physics 122 (115502). https://doi.org/10.1063/1.4992041.

Züfle, Simon, et al. “Determination of Charge Transport Activation Energy and Injection Barrier in Organic Semiconductor Devices.” Journal of Applied Physics, vol. 122, no. 115502, Sept. 2017, https://doi.org/10.1063/1.4992041.