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  2. School of Engineering
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dc.contributor.authorBeierlein, T. A.-
dc.contributor.authorRuhstaller, Beat-
dc.contributor.authorGundlach, D. J.-
dc.contributor.authorRiel, H.-
dc.contributor.authorKarg, S.-
dc.contributor.authorRost, C.-
dc.contributor.authorRiess, W.-
dc.date.accessioned2018-06-15T14:21:59Z-
dc.date.available2018-06-15T14:21:59Z-
dc.date.issued2003-06-02-
dc.identifier.issn0379-6779de_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/6968-
dc.description.abstractSystematic studies are a prerequisite for a detailed understanding of the internal processes in organic semiconductors and devices, which is of great importance for optimizing organic light-emitting diode performance. Devices based on small molecules are especially well-suited for introducing thin layers (<10 nm), which in turn can be used as analysis and sensing tools. We use combinatorial methods to fabricate matrices of 10×10 individual devices on single substrate in order to ensure reliable and reproducible datasets. We present selected examples to illustrate the strength of this method. These experiments include layer thickness variations in a multilayer system to optimize device performance. A thin metallic and dye-doped sensing layer is inserted into the device to derive the distribution of the electrical field and exciton density, respectively. By means of thickness-dependent photoluminescent measurements we gain insight into luminescence quenching near interfaces.de_CH
dc.language.isoende_CH
dc.publisherElsevierde_CH
dc.relation.ispartofSynthetic Metalsde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subject.ddc621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnikde_CH
dc.titleInvestigation of internal processes in organic light-emitting devices using thin sensing layersde_CH
dc.typeBeitrag in wissenschaftlicher Zeitschriftde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitute of Computational Physics (ICP)de_CH
dc.identifier.doi10.1016/S0379-6779(02)01269-9de_CH
zhaw.funding.euNode_CH
zhaw.issue1–2de_CH
zhaw.originated.zhawYesde_CH
zhaw.pages.end221de_CH
zhaw.pages.start213de_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.volume138de_CH
zhaw.publication.reviewPeer review (Publikation)de_CH
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Beierlein, T. A., Ruhstaller, B., Gundlach, D. J., Riel, H., Karg, S., Rost, C., & Riess, W. (2003). Investigation of internal processes in organic light-emitting devices using thin sensing layers. Synthetic Metals, 138(1–2), 213–221. https://doi.org/10.1016/S0379-6779(02)01269-9
Beierlein, T.A. et al. (2003) ‘Investigation of internal processes in organic light-emitting devices using thin sensing layers’, Synthetic Metals, 138(1–2), pp. 213–221. Available at: https://doi.org/10.1016/S0379-6779(02)01269-9.
T. A. Beierlein et al., “Investigation of internal processes in organic light-emitting devices using thin sensing layers,” Synthetic Metals, vol. 138, no. 1–2, pp. 213–221, Jun. 2003, doi: 10.1016/S0379-6779(02)01269-9.
BEIERLEIN, T. A., Beat RUHSTALLER, D. J. GUNDLACH, H. RIEL, S. KARG, C. ROST und W. RIESS, 2003. Investigation of internal processes in organic light-emitting devices using thin sensing layers. Synthetic Metals. 2 Juni 2003. Bd. 138, Nr. 1–2, S. 213–221. DOI 10.1016/S0379-6779(02)01269-9
Beierlein, T. A., Beat Ruhstaller, D. J. Gundlach, H. Riel, S. Karg, C. Rost, and W. Riess. 2003. “Investigation of Internal Processes in Organic Light-Emitting Devices Using Thin Sensing Layers.” Synthetic Metals 138 (1–2): 213–21. https://doi.org/10.1016/S0379-6779(02)01269-9.
Beierlein, T. A., et al. “Investigation of Internal Processes in Organic Light-Emitting Devices Using Thin Sensing Layers.” Synthetic Metals, vol. 138, no. 1–2, June 2003, pp. 213–21, https://doi.org/10.1016/S0379-6779(02)01269-9.


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