Publication type: Conference paper
Type of review: Editorial review
Title: Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers
Authors: Dicker, Jochen
Schumacher, Jürgen
Sölter, Jens
Zimmermann, Walter
Bau, Sandra
Warta, Wilhelm
Proceedings: Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the international conference held in Glasgow, United Kingdom, 1 - 5 May 2000
Volume(Issue): 2
Page(s): 1459
Pages to: 1462
Conference details: 16th European Photovoltaic Solar Energy Conference, Glasgow, UK, 1-5 May 2000
Issue Date: 2000
Publisher / Ed. Institution: James and James
Publisher / Ed. Institution: London
ISBN: 1-902916-18-2
Language: English
Subjects: Sio2 barrier; Thin film; Silicon solar cells; Simulation
Subject (DDC): 621.3: Electrical, communications, control engineering
URI: https://www.osti.gov/etdeweb/biblio/20195361
https://digitalcollection.zhaw.ch/handle/11475/11718
Fulltext version: Published version
License (according to publishing contract): Licence according to publishing contract
Departement: School of Engineering
Organisational Unit: Institute of Computational Physics (ICP)
Appears in collections:Publikationen School of Engineering

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Dicker, J., Schumacher, J., Sölter, J., Zimmermann, W., Bau, S., & Warta, W. (2000). Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers [Conference paper]. Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the International Conference Held in Glasgow, United Kingdom, 1 - 5 May 2000, 2, 1459–1462. https://www.osti.gov/etdeweb/biblio/20195361
Dicker, J. et al. (2000) ‘Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers’, in Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the international conference held in Glasgow, United Kingdom, 1 - 5 May 2000. London: James and James, pp. 1459–1462. Available at: https://www.osti.gov/etdeweb/biblio/20195361.
J. Dicker, J. Schumacher, J. Sölter, W. Zimmermann, S. Bau, and W. Warta, “Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers,” in Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the international conference held in Glasgow, United Kingdom, 1 - 5 May 2000, 2000, vol. 2, pp. 1459–1462. [Online]. Available: https://www.osti.gov/etdeweb/biblio/20195361
DICKER, Jochen, Jürgen SCHUMACHER, Jens SÖLTER, Walter ZIMMERMANN, Sandra BAU und Wilhelm WARTA, 2000. Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers. In: Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the international conference held in Glasgow, United Kingdom, 1 - 5 May 2000 [online]. Conference paper. London: James and James. 2000. S. 1459–1462. ISBN 1-902916-18-2. Verfügbar unter: https://www.osti.gov/etdeweb/biblio/20195361
Dicker, Jochen, Jürgen Schumacher, Jens Sölter, Walter Zimmermann, Sandra Bau, and Wilhelm Warta. 2000. “Numerical Analysis of Crystalline Silicon Thin Film Solar Cells on Perforated SiO2 Barrier Layers.” Conference paper. In Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the International Conference Held in Glasgow, United Kingdom, 1 - 5 May 2000, 2:1459–62. London: James and James. https://www.osti.gov/etdeweb/biblio/20195361.
Dicker, Jochen, et al. “Numerical Analysis of Crystalline Silicon Thin Film Solar Cells on Perforated SiO2 Barrier Layers.” Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the International Conference Held in Glasgow, United Kingdom, 1 - 5 May 2000, vol. 2, James and James, 2000, pp. 1459–62, https://www.osti.gov/etdeweb/biblio/20195361.


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